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Conference International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1995 : Kiev, Ukraine)

TÍtulo International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : [proceedings] 11-13 May, 1995, Kiev, Ukraine / Sergey V. Svechnikov, Mikhail Ya. Valakh, chairs/editors ; organized by SPIE Ukraine Chapter ... [et al.] ; sponsored by International Association of the Academies of Sciences ... [et al.] ; published by SPIE--the International Society for Optical Engineering.

Publicacion Bellingham, Wash : SPIE, c1995.

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Localización Call No. Estado
 IU 3rd Floor  TK7871 .I572 1995    CHECK ON SHELF
Descripcion xv, 768 p : ill ; 28 cm.
Coleccion Proceedings / SPIE--the International Society for Optical Engineering ; v. 2648
Proceedings of SPIE--the International Society for Optical Engineering ; v. 2648.
Bibliography Includes bibliographic references and author index.
Materia Electronics -- Materials -- Optical properties -- Congresses.
Electronics -- Materials -- Testing -- Congresses.
Optoelectronics -- Materials -- Optical properties -- Congresses.
Microelectronics -- Materials -- Optical properties -- Congresses.
Quantum electronics -- Materials -- Optical properties -- Congresses.
Autor Secundario Svechnikov, Sergeĭ Vasil′evich.
Valakh, M. ︠I︡A (Mikhail ︠I︡Akovlevich)
SPIE Ukraine Chapter.
International Association of the Academies of Sciences.
Society of Photo-optical Instrumentation Engineers.
ISBN 0819420212
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